Design And Construction Of A Transistor Tester Circuit

ABSTRACT

This work is transistor tester. This transistor tester circuit uses 555 timer IC for testing both PNP and NPN transistors. This circuit is simple as compared to other transistor testers, and therefore, is useful for technicians as well as students. The circuit is developed using basic electronic components like resistors, diodes, LEDs and NE5555 are used. By using this circuit, different faults can be checked –like to know whether the condition of a transistor is good or not, and opened or shorted, and so on.

TABLE OF CONTENTS

TITLE PAGE

APPROVAL PAGE

DEDICATION

ACKNOWLEDGEMENT

ABSTRACT

TABLE OF CONTENT

CHAPTER ONE

1.0      INTRODUCTION

1.1      BACKGROUND OF THE PROJECT
1.2      AIM OF THE PROJECT
1.3      OBJECTIVE OF THE PROJECT
1.4      SIGNIFICANCE OF THE PROJECT
1.5      PURPOSE OF THE PROJECT
1.6      APPLICATION OF THE PROJECT
1.7      ADVANTAGES OF THE PROJECT
1.8      PROBLEM/LIMITATION OF THE PROJECT
1.9      PROJECT ORGANISATION

CHAPTER TWO

2.0     LITERATURE REVIEW

2.1      REVIEW OF RELATED STUDIES

2.2      REVIEW OF RELATED TERMS

2.3      OVERVIEW OF TRANSISTOR

2.4      TRANSISTOR FAULTS

CHAPTER THREE

3.0     CONSTRUCTION METHODOLOGY

3.1      SYSTEM CIRCUIT DIAGRAM

3.2     SYSTEM OPERATION

3.3      CIRCUIT DESCRIPTION

3.4      SYSTEM CIRCUIT DIAGRAM

3.5      CIRCUIT OPERATION

3.6 IMPORTANCE AND FUNCTION OF THE MAJOR COMPONENTS USED IN THIS CIRCUIT

3.7      POWER SUPPLY UNIT

CHAPTER FOUR

RESULT ANALYSIS

4.0      CONSTRUCTION PROCEDURE AND TESTING

4.1      CASING AND PACKAGING

4.2      ASSEMBLING OF SECTIONS

4.3      TESTING

4.4.1 PRE-IMPLEMENTATION TESTING

4.4.2  POST-IMPLEMENTATION TESTING

4.5      RESULT

4.6      COST ANALYSIS

4.7      PROBLEM ENCOUNTERED

CHAPTER FIVE

5.1      CONCLUSION

5.2      RECOMMENDATION

5.3      REFERENCES

 

2.0 INTRODUCTION:

This chapter provides the background and context of the research problems, reviews the existing literature on the Design And Construction Of A Transistor Tester Circuit, and acknowledges the contributions of scholars who have previously conducted similar research [REV3308] …

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