Design And Construction Of An Easy Transistor Tester
The design and construction of an easy transistor tester involve creating a device capable of quickly and accurately identifying the type and characteristics of transistors. This project typically integrates components such as resistors, capacitors, and LEDs, along with a microcontroller or dedicated transistor tester IC. The tester operates by applying a small voltage across the transistor’s terminals and measuring its response, which can include parameters like gain, leakage, and breakdown voltage. By analyzing the transistor’s behavior, the tester can determine its type (such as NPN or PNP) and key specifications. Construction of the tester involves assembling the circuit on a prototyping board or PCB, ensuring proper connections and component placement. Testing and calibration are crucial steps to verify the functionality and accuracy of the device. Additionally, incorporating user-friendly features such as a display screen and intuitive controls enhances usability, making it accessible even to beginners in electronics.
ABSTRACT
This device is used to check whether a transistor is faulty or not. The circuit employs the properties of the gates of low power IC 4093. It is a NAND IC with four gates that can be designed in various ways. From the circuit first gate (N1) is designed as a simple oscillator with resistor R1 and capacitor C2. The remaining gates are used as inverters and buffers. The output of gate N1 (pin 3) is fed to gate N2 (pin 4), which, in turn, is used to drive the green half of bicolour LED1.
TABLE OF CONTENTS
TITLE PAGE
APPROVAL PAGE
DEDICATION
ACKNOWLEDGEMENT
ABSTRACT
TABLE OF CONTENT
CHAPTER ONE
1.0 INTRODUCTION
1.1 BACKGROUND OF THE PROJECT
1.2 AIM OF THE PROJECT
1.3 OBJECTIVE OF THE PROJECT
1.4 SIGNIFICANCE OF THE PROJECT
1.5 PURPOSE OF THE PROJECT
1.6 APPLICATION OF THE PROJECT
1.7 ADVANTAGES OF THE PROJECT
1.8 PROBLEM/LIMITATION OF THE PROJECT
1.9 PROJECT ORGANISATION
CHAPTER TWO
2.0 LITERATURE REVIEW
2.1 REVIEW OF RELATED STUDIES
2.2 REVIEW OF RELATED TERMS
2.3 TRANSISTOR FAULTS
2.4 OVERVIEW OF NPN AND PNP TRANSISTORS
CHAPTER THREE
3.0 CONSTRUCTION METHODOLOGY
3.1 SYSTEM CIRCUIT DIAGRAM
3.2 SYSTEM OPERATION
3.3 CIRCUIT DESCRIPTION
3.4 SYSTEM CIRCUIT DIAGRAM
3.5 CIRCUIT OPERATION
3.6 IMPORTANCE AND FUNCTION OF THE MAJOR COMPONENTS USED IN THIS CIRCUIT
3.7 POWER SUPPLY UNIT
CHAPTER FOUR
RESULT ANALYSIS
4.0 CONSTRUCTION PROCEDURE AND TESTING
4.1 CASING AND PACKAGING
4.2 ASSEMBLING OF SECTIONS
4.3 TESTING
4.4.1 PRE-IMPLEMENTATION TESTING
4.4.2 POST-IMPLEMENTATION TESTING
4.5 RESULT
4.6 COST ANALYSIS
4.7 PROBLEM ENCOUNTERED
CHAPTER FIVE
5.1 CONCLUSION
5.2 RECOMMENDATION
5.3 REFERENCES
An Easy Transistor Tester
The cathode of green LED1 gives the collector current for the transistor under test (TUT). The base of the TUT gets biasing voltage from the output of gate N2 to invert the signal. The emitter of the TUT is connected to the outputs of gate N3 and N4.
Circuit operation
If the TUT inserted in the socket is npn type, the current flows from output pin 4 of gate N4 through bicolour LED1 and its green half glows. This is due to conduction of the TUT. If the transistor is pnp type, the current flow is reversed and the red half of bicolour LED1 glows. This happens due to the high state of outputs at pins 10 and 11 of gates N3 and N4, respectively. This is because output pin 4 of N2 is at low level. The status of bicolour LED1 for different conditions of the transistor is shown in Table I.
Bicolour LED1 used in the circuit is a two-lead version with red and green LEDs connected in inverse parallel inside a common case. The cathode of one LED forms the anode of the other, so depending on the direction of current flow either red or green LED lights up.
Construction & testing
Assemble the circuit on a general purpose PCB and enclose it in a small case. In various transistors, the pin configurations are different, so it is necessary to go through the datasheets to identify the pins. Table II shows the pin-outs of some common transistors.
The article was first published in June 2006 and has recently been updated.
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